AI-Native Inspection

Every voxel.
Every defect.
Every time.

VoxelMind is autonomous CT inspection for semiconductor packaging. AI that reads 3D scans and catches what human eyes miss, at production speed.

BGA VoidDetected
Solder BridgeClear
DelaminationDetected
Wire BondClear
Die AttachClear
Micro-CrackDetected
01

Manual CT analysis is the bottleneck

Skilled engineers spend hours reviewing CT scans slice by slice. As packaging density increases, inspection time grows exponentially while talent stays scarce.

02

Hardware companies ignore software

ZEISS, Nikon, and Waygate build world-class CT hardware. Their analysis software is an afterthought. Bolted-on, manual, and slow.

03

2D inspection can not see inside

Optical and X-ray 2D inspection catches surface defects. Hidden voids, internal cracks, and subsurface delamination require 3D CT analysis.

What VoxelMind Does

Autonomous Defect Detection

Analyzes full 3D CT volumes automatically. Identifies voids, cracks, solder bridging, delamination, and wire bond failures without human intervention. Reports confidence scores and defect coordinates.

Hardware-Agnostic Platform

Works with CT data from any scanner. ZEISS, Nikon, YXLON, Waygate. Upload DICOM, TIFF stacks, or raw voxel data. No vendor lock-in.

Process Intelligence

Tracks defect patterns over time. Correlates failures with process parameters. Predicts quality issues before they cascade through your production line.

SMT-Native Understanding

Built by packaging engineers, not generic computer vision. Understands BGA, QFN, flip-chip, PoP, SiP architectures. Knows what a real defect looks like versus acceptable variation.

The future of semiconductor quality
is not more engineers staring at screens.
It is AI that never blinks.

VoxelMind is building the inspection layer for the next generation of chip manufacturing.